Exploration of 'over kill effect' of high-LET Ar- and Fe-ions by evaluating the fraction of non-hit cell and interphase death
Date
2005Author
Mehnati, P
Morimoto, S
Yatagai, F
Furusawa, Y
Kobayashi, Y
Wada, S
Kanai, T
Hanaoka, F
Sasaki, H
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The reason why RBE for cell killing fell to less than unity (1.0) with very high-LET heavy-ions ( 40 Ar: 1,640 keV/?m; 56 Fe: 780, 1,200, 2,000 keV/?m) was explored by evaluating the fraction of non-hit cell (time-lapse observation) and cells undergoing interphase death (calculation based on our previous data). CHO cells were exposed to 4 Gy (30% survival dose) of Ar (1,640 keV/?m) or Fe-ions (2,000 keV/?m). About 20% of all cells were judged to be non-hit, and about 10% cells survived radiation damage. About 70% cells died after dividing at least once (reproductive death) or without dividing (interphase death). RBE for reproductive (RBE[R]) and interphase (RBE[I]) death showed a similar LET dependence with maximum around 200 keV/?m. In this LET region, at 30% survival level, about 10% non-survivors underwent interphase death. The corresponding value for very high-LET Fe-ions (2,000 keV/?m) was not particularly high (?15%), whereas that for X-rays was less than 3%. However, reproductive death (67%) predominated over interphase death (33%) even in regard to rather severely damaged cells (1% survival level) after exposure to Fe-ions (2,000 keV/?m ). These indicate that interphase death is a type of cell death characteristic for the cells exposed to high-LET radiation and is not caused by `cellular over kill effect'. Both NHF37 (non-hit fraction at 37% survival) and inactivation cross-section for reproductive death (?[R]) began to increase when LET exceeded 100 keV/?m. The exclusion of non-hit fraction in the calculation of surviving fraction partially prevented the fall of RBE[R] when LET exceeded 200 keV/?m. On the other hand, the mean number of lethal damage per unit dose (NLD/Gy) showed the same LET-dependent pattern as RBE[R]. These suggest that the increase in non-hit fraction and ?[R] with an increasing LET is caused by enhanced clustering of ionization and DNA damage which lowers the energy efficiency for producing damage and RBE.
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