| dc.description.abstract | Objective. To investigate, by means of FE analysis, the effect of surface roughness treatments on the distribution of stresses at the bone-implant interface in immediately loaded mandibular implants. Materials and methods. An accurate, high resolution, digital replica model of bone structure (cortical and trabecular components) supporting an implant was created using CT scan data and image processing software (Mimics 13.1; Materialize, Leuven, Belgium). An anatomically accurate 3D model of a mandibular-implant complex was created using a professional 3D-CAD modeller (SolidWorks, DassaultSystemes Solid Works Corp; 2011). Finite element models were created with one of the four roughness treatments on the implant fixture surface. Of these, three were surface treated to create a uniform coating determined by the coefficient of friction (mu); these were either (1) plasma sprayed or porous-beaded (mu = 1.0), (2) sandblasted (mu = 0.68) or (3) polished (mu = 0.4). The fourth implant had a novel two-part surface roughness consisting of a coronal polished component (mu = 0.4) interfacing with the cortical bone, and a body plasma treated surface component (mu = 1) interfacing with the trabecular bone. Finite element stress analysis was carried out under vertical and lateral forces. Results. This investigation showed that the type of surface treatment on the implant fixture affects the stress at the bone-implant interface of an immediately loaded implant complex. Von Mises stress data showed that the two-part surface treatment created the better stress distribution at the implant-bone interface. Significance. The results from this FE computational analysis suggest that the proposed two-part surface treatment for IL implants creates lower stresses than single uniform treatments at the bone-implant interface, which might decrease pen-implant bone loss. Future investigations should focus on mechanical and clinical validation of these FE results. (C) 2014 Academy of Dental Materials. Published by Elsevier Ltd. All rights reserved. | |
